EBSD 2010
May 5th & 6th, 2010
Advanced methods in EBSD (Electron Backscattered Diffraction)
Welcome to the EBSD 2010 web site !
The symposium will take place at the SMS Materials Centre
of the Ecole des Mines de Saint Etienne
on the 5th and 6th May 2010.
The development of new and advanced materials goes hand in hand with the development of new characterization techniques. EBSD (Electron Backscattered Diffraction) is a relatively new technique that now provides rapid local orientation measurements of most crystalline materials. The resulting orientation maps have made a significant contribution to understanding material behaviour and have now become a standard tool in many scientific and industrial laboratories.
However, over the last few years there have been new developments in EBSD which go beyond standard orientation mapping and open up new perspectives: key challenges in materials characterization that could be addressed by these new developments include:
- In-situ loading and heating
- 3D microstructures
- High angular resolution for local elastic strains and GNDs
- Kikuchi band simulations
- Local orientation and composition changes
The aim of this two-day symposium is to present these new techniques and discuss their implications for future materials and mechanics research. The symposium will be composed of 15 invited lectures plus poster presentations. We look forward to welcoming a number of EBSD users who could assess and discuss these new developments with the people directly involved.
Invited speakers are Andras Borbely, Nathalie Bozzolo, Cyril Cayron, Austin Day, David Dingley, Mike Ferry, Lionel Germain, Anne-Laure Helbert, Claire Maurice, Wolfgang Pantleon, Edgar Rauch, Carol Trager-Cowan, Patrick Villechaise, Angus Wilkinson, and Aimo Winkelmann.
