Tuesday, June 28 |
Wednesday, June 29 |
Thursday, June 30 |
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09h00-10h00 Registration |
09h00-09h50 Keynote Lecture |
09h00-09h50 Keynote Lecture |
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10h00-10h30 Welcome / Opening |
09h50-10h20 Advanced Tools (1) |
09h50-10h20 Imaging Systems and Sensors (1) |
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10h30-11h20 Keynote Lecture |
10h20-10h50 Pause |
10h20-10h50 Pause |
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11h20-12h20 Interferometry (2) |
10h50-12h10 Stereovision (3) |
10h50-12h20 Imaging Systems and Sensors (3) |
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12h30-14h00 Lunch |
12h30-14h00 Lunch |
12h30-14h00 Lunch |
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14h00-15h30 Size/Shape Measurements (3) |
14h00-14h30 Poster Session |
14h00-15h30 Motion/Registration (3) |
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14h30-16h30 Texture and Surface Inspection (4) |
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15h30-16h00 Pause |
15h30-16h00 Closing |
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16h00-17h00 Data Fusion (2) |
16h30-17h15 Free Time |
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17h15 Bus departure |
22 Talks (30mn - questions included) |
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17h30-19h00 Museum Guided Tour |
Posters | |||
19h30-22h00 QCAV Workshop Commitee Dinner |
19h00-22h30 Gala Dinner |
3 Keynote Lectures (50mn - questions included) |
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22h30 Bus departure |
09h00-10h00 | Registration |
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10h00-10h30 | Welcome / Opening |
10h30-11h20 | Invited Keynote Lecture |
Industrial Applications of Image Processing, Unsolved Problems to Establish Taylor-made Technology Seiji Hata / Kagawa University (Japan) |
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11h20-12h20 | Lecture Session / Interferometry (I) |
Nano-level 3D shape measurement system using color analysis method of RGB interference images S. Hata, D. Kimura, M. Kaneda, S. Morimoto, H. Kobayashi |
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Multiwavelength single-shot interferometry without carrier fringe introduction K. Kitagawa |
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12h30-14h00 | Lunch |
14h00-15h30 | Lecture Session: Size/Shape Measurements (SSM) |
Recognizing overlapped particles during a crystallization process from in situ video images for measuring their size distributions O. Suleiman Ahmad, J. Debayle, N. Gherras, B. Presles, G. Févotte, J.-C. Pinoli |
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Extracting the ridge set as a graph for quantification of actin filament images obtained by confocal laser scanning microscopy H. Birkholz |
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Distance maps and inscribed convex sets for shape classification applied to road signs F. Robert-Inacio |
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15h30-16h00 | Coffee break |
16h00-17h00 | Lecture Session: Data Fusion (DF) |
Automatic classification of 3D segmented CT data using data fusion and support vector machine Osman, V. Kaftandjian, U. Hassler |
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Fusion of geometric and thermographic data for the automatic inspection of forgings and castings B. Oswald-Tranta, P. O'Leary |
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19h00-22h00 | QCAV Committee Dinner |
09h00-09h50 | Invited Keynote Lecture |
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Non conventional imaging system for 3D inspection of transparent objects Fabrice Meriaudeau / University of Burgundy (France) |
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09h50-10h20 | Lecture Session / Advanced Tools (AT) |
Combining high productivity and high performance in image processing using Single Assignment C V. Wieser, B. Moser, S. Scholz, S. Herhut, J. Guo |
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10h20-10h50 | Coffee break |
10h50-12h20 | Lecture Session / Stereovision (S) |
Illumination control in view of dynamic (re)planning of 3D reconstruction tasks A. Belhaoua, S. Kohler, E. Hirsch |
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Using variable homography to measure emergent fibers on textile fabrics J. Xu, C. Cudel, S. Kohler, O. Haeberlé, M. Klotz |
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Defect detection of electronic devices by single stereo vision A. Kusano, T. Watanabe, T. Funahashi, T. Fujiwara, H. Koshimizu |
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12h30-14h00 | Lunch |
14h00-14h30 | Poster Session |
An algorithm for a progressive acquisition image sensor P. Leni, Y. D. Fougerolle, F. Truchetet |
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Shape matching by affine movement estimation for 3D reconstruction M. Saidani, F. Ghorbel |
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14h30-16h30 | Lecture Session: Texture and Surface Inspection (TSI) |
A template matching approach based on the discrepancy norm for defect detection on regularly textured surfaces J. Bouchot, G. Stübl, B. Moser |
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Unsupervised segmentation based on Von Mises circular distributions for orientation estimation in textured images J. Da Costa, F. Galland, A. Roueff, C. Germain |
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Algorithms for microindentation measurement in automated Vickers hardness testing M. Gadermayr, A. Maier,A. Uhl |
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Measuring image sharpness for a computer vision-based Vickers hardness measurement system A. Maier, G. Niederbrucker, A. Uhl |
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16h30-17h15 | Free time |
17h15 | Bus departure from Espace Fauriel |
17h30-19h00 | Museum Guided Tour |
19h00-22h30 | Gala Dinner |
22h30 | Bus departure from Museum |
09h00-09h50 | Invited Keynote Lecture |
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Cellular image analysis of biological samples and quality Claude Lambert / ENSM-CHU, Saint-Etienne (France) |
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09h50-10h20 | Lecture Session / Imaging Systems and Sensors (ISS) |
Creation of an artifact database and experimental measurement of their detectability thresholds in noises of different spectra in the context of quality control of an X-ray imager J. Vignolle, L. Debize, I. Bensaid, R. Forich, C. Berthaud, C. Marmajou, B. Candiard |
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10h20-10h50 | Coffee Break |
10h50-12h20 | Lecture Session / Imaging Systems and Sensors (ISS) |
Evaluation of the reasons why freshly appearing citrus peel fluorescence during automatic inspection by fluorescent imaging technique M. A. Momin, N. Kondo, M. Kuramoto, Y. Ogawa, K. Yamamoto, T. Shiigi |
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Secondary radiations in CBCT: a simulation study P. Wils, J. M. Létang, J. Bruandet |
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A proposal of virtual lens model by using multi-camera array K. Takahashi, K. Kato, K. Yamamoto |
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12h30-14h00 | Lunch |
14h00-15h30 | Lecture Session: Motion/Registration (MR) |
Automatic quantitative evaluation of image registration techniques on retinal images with the epsilon dissimilarity criterion in the case of retinal images Y. Gavet, M. Fernandes, J.-C. Pinoli |
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Mobile robot control using 3D hand pose estimation K. Hoshino, T. Kasahara, N. Igo, M. Tomida, T. Tanimoto, T. Mukai, G. Brossard, H. Kotani |
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Non-rigid registration for qualitiy control of printed materials A. Badshah, P. O'Leary, M. Harker, C. Sallinger |
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15h30-16h00 | Closing |